陈峰教授课题组发现“缺陷增强二维材料纵向电子迁移现象”
近日,William官网陈峰教授课题组发现,二维材料表面的缺陷可以增强多层二维材料间纵向电子迁移,该现象在光电响应、表面拉曼增强等领域均有应用价值。相关成果以“Enhancement of Out-of-Plane Charge Transport in a Vertically Stacked Two-Dimensional Heterostructure Using Point Defects”和“Enhanced Raman Scattering of CuPc Films on Imperfect WSe2 Monolayer Correlated to Exciton and Charge‐Transfer Resonances...